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Van Allen Probes
Authors: Bingley L., Angelopoulos V, Sibeck D., Zhang X., and Halford A.
Title: The Evolution of a Pitch‐Angle “Bite‐Out” Scattering Signature Caused by EMIC Wave Activity: A Case Study
Abstract: Electromagnetic ion cyclotron (EMIC) waves are understood to be one of the dominant drivers of relativistic electron loss from Earth's radiation belts. Theory predicts that the associated gyroresonant wave‐particle interaction results in a distinct energy‐dependent “bite‐out” signature in the normalized flux distribution of electrons as they are scattered into the loss cone. We identify such signatures along with the responsible EMIC waves captured in situ by the Van Allen Probes on 15–16 February 2017. Using the cold plasma approximation, we predict the pitch‐angle cutoffs for the scattering signature for the captured EMIC wave and find it in good agreement with the observed electron bite‐out scattering signature. Employing the close conjunction between the Van Allen Probe. . .
Date: 06/2019 Publisher: Journal of Geophysical Research: Space Physics DOI: 10.1029/2018JA026292 Available at: https://agupubs.onlinelibrary.wiley.com/doi/10.1029/2018JA026292
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