Biblio

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Filters: Author is Peplowski, P. N.  [Clear All Filters]
2014
Authors: Holmes-Siedle A G, Goldsten J O, Maurer R H, and Peplowski P N
Title: RadFET Dosimeters in the Belt: the Van Allen Probes on Day 365
Abstract: Van Allen Probes A and B, launched more than a year ago (in August 2012), carried 16 p-channel metal-oxide-semiconductor Radiation-sensitive Field Effect Transistors (RadFET)s into an orbit designed by NASA to probe the heart of the trapped-radiation belts. Nearly 350 days of in situ measurements from the Engineering Radiation Monitor (ERM) (1) demonstrated strong variations of dose rates with time, (2) revealed a critical correlation between the ERM RadFET dosimeters and the ERM Faraday cup data on charged particles, and (3) permitted the mapping of the belts by measuring variation with orbit altitude. This paper provides an update on early results given in a NSREC2012 paper along with details and discussion of the RadFET dosimetry data analyzed .
Date: 04/2014 Publisher: IEEE Transactions on Nuclear Science Pages: 948 - 954 DOI: 10.1109/TNS.2014.2307012 Available at: http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6786389
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Authors: Holmes-Siedle A.G., Maurer R H, and Peplowski P N
Title: RadFET Dosimeters in the Belt: the Van Allen Probes on Day 365
Abstract: Van Allen Probes A and B, launched more than a year ago (in August 2012), carried 16 p-channel metal-oxide-semiconductor Radiation-sensitive Field Effect Transistors (RadFET)s into an orbit designed by NASA to probe the heart of the trapped-radiation belts. Nearly 350 days of in situ measurements from the Engineering Radiation Monitor (ERM) (1) demonstrated strong variations of dose rates with time, (2) revealed a critical correlation between the ERM RadFET dosimeters and the ERM Faraday cup data on charged particles, and (3) permitted the mapping of the belts by measuring variation with orbit altitude. This paper provides an update on early results given in a NSREC2012 paper along with details and discussion of the RadFET dosimetry data analyzed .
Date: 04/2014 Publisher: IEEE Transactions on Nuclear Science Pages: 948-954 DOI: N/A Available at: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6786389
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2013
Authors: Maurer Richard, Goldsten J O, Peplowski P N, Holmes-Siedle A G, Butler Michael, et al.
Title: Early Results from the Engineering Radiation Monitor (ERM) and Solar Cell Monitor on the Van Allen Probes Mission
Abstract: The Engineering Radiation Monitor (ERM) measures dose, dose rate and charging currents on the Van Allen Probes mission to study the dynamics of earth's Van Allen radiation belts. Early results from this monitor show a variation in dose rates with time, a correlation between the dosimeter and charging current data, a map of charging current versus orbit altitude and a comparison of cumulative dose to pre-launch modeling after 260 days. Solar cell degradation monitor patches track the decrease in solar array output as displacement damage accumulates.
Date: 11/2013 Publisher: IEEE DOI: 10.1109/TNS.2013.2281937 Available at: http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6651707
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Authors: Goldsten J O, Maurer R H, Peplowski P N, Holmes-Siedle A G, Herrmann C C, et al.
Title: The Engineering Radiation Monitor for the Radiation Belt Storm Probes Mission
Abstract: An Engineering Radiation Monitor (ERM) has been developed as a supplementary spacecraft subsystem for NASA’s Radiation Belt Storm Probes (RBSP) mission. The ERM will monitor total dose and deep dielectric charging at each RBSP spacecraft in real time. Configured to take the place of spacecraft balance mass, the ERM contains an array of eight dosimeters and two buried conductive plates. The dosimeters are mounted under covers of varying shielding thickness to obtain a dose-depth curve and characterize the electron and proton contributions to total dose. A 3-min readout cadence coupled with an initial sensitivity of ∼0.01 krad should enable dynamic measurements of dose rate throughout the 9-hr RBSP orbit. The dosimeters are Radiation-sensing Field Effect Transistors (RadFETs) and operate. . .
Date: 11/2013 Publisher: Space Science Reviews DOI: 10.1007/s11214-012-9917-x Available at: http://link.springer.com/article/10.1007%2Fs11214-012-9917-x
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