Internal Charging Hazards in Near-Earth Space During Solar Cycle 24 Maximum: Van Allen Probes Measurements

TitleInternal Charging Hazards in Near-Earth Space During Solar Cycle 24 Maximum: Van Allen Probes Measurements
Publication TypeJournal Article
Year of Publication2015
AuthorsSkov, TMulligan, Fennell, JF, Roeder, JL, J. Blake, B, Claudepierre, SG
JournalIEEE Transactions on Plasma Science
Volume43
Issue9
Pagination3070 - 3074
Date Published09/2015
ISSN0093-3813
Keywordsartificial satellites; dielectric materials; electrons; Energy measurement; MAGEis; Magnetosphere; particle detectors; protons; Van Allen Probes
AbstractThe Van Allen Probes mission provides an unprecedented opportunity to make detailed measurements of electrons and protons in the inner magnetosphere during the weak solar maximum period of cycle 24. The MagEIS suite of sensors measures energy spectra and fluxes of charged particles in the space environment. The calculations show that these fluxes result in electron deposition rates high enough to cause internal charging. We use omnidirectional fluxes of electrons and protons to calculate the dose under varying materials and thicknesses of shielding. We show examples of charge deposition rates during the times of nominal and high levels of penetrating fluxes in the inner magnetosphere covering the period from the beginning of 2013 through mid-2014. These charge deposition rates are related to charging levels quite possibly encountered by shielded dielectrics with different resistivities. Using a simple model, we find temporal profiles for different materials showing the long-term charge deposition rate and estimated charge density levels reaching high levels. These levels are an indicator of internal charging rates that satellites might possibly experience in the inner magnetosphere. The results are compared with charge densities that can induce internal electrostatic discharge.
URLhttp://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=7247811http://xplorestaging.ieee.org/ielx7/27/7247791/07247811.pdf?arnumber=7247811
DOI10.1109/TPS.2015.2468214
Short TitleIEEE Trans. Plasma Sci.


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