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Electronic devices on the Van Allen Probes mission have experienced more than a thousand single-event effects (SEE) during the 4.5 years of transit through the inner and outer earth trapped radiation belts. The majority of these SEE have been due to trapped protons determined by the orbit timing and the dose rate response of the engineering radiation monitor. Fault tolerant systems engineering and spacecraft operation have enabled a successful mission to date without a safe mode or spacecraft emergency.
YEAR: 2017   DOI: 10.1109/TNS.2017.2754878
The Electric and Magnetic Field Instrument and Integrated Science (EMFISIS) investigation on the NASA Radiation Belt Storm Probes (now named the Van Allen Probes) mission provides key wave and very low frequency magnetic field measurements to understand radiation belt acceleration, loss, and transport. The key science objectives and the contribution that EMFISIS makes to providing measurements as well as theory and modeling are described. The key components of the instruments suite, both electronics and sensors, including ke ...
Kletzing, C.; Kurth, W.; Acuna, M.; MacDowall, R.; Torbert, R.; Averkamp, T.; Bodet, D.; Bounds, S.; Chutter, M.; Connerney, J.; Crawford, D.; Dolan, J.; Dvorsky, R.; Hospodarsky, G.; Howard, J.; Jordanova, V.; Johnson, R.; Kirchner, D.; Mokrzycki, B.; Needell, G.; Odom, J.; Mark, D.; Pfaff, R.; Phillips, J.; Piker, C.; Remington, S.; Rowland, D.; Santolik, O.; Schnurr, R.; Sheppard, D.; Smith, C.; Thorne, R.; Tyler, J.;
YEAR: 2013   DOI: 10.1007/s11214-013-9993-6