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Van Allen Probes Bibliography is from August 2012 through September 2021
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Electronic devices on the Van Allen Probes mission have experienced more than a thousand single-event effects (SEE) during the 4.5 years of transit through the inner and outer earth trapped radiation belts. The majority of these SEE have been due to trapped protons determined by the orbit timing and the dose rate response of the engineering radiation monitor. Fault tolerant systems engineering and spacecraft operation have enabled a successful mission to date without a safe mode or spacecraft emergency.
Published by: IEEE Transactions on Nuclear Science Published on: 09/2017
YEAR: 2017   DOI: 10.1109/TNS.2017.2754878