Radiation-Induced Single-Event Effects on the Van Allen Probes Spacecraft

Author
Keywords
Abstract
Electronic devices on the Van Allen Probes mission have experienced more than a thousand single-event effects (SEE) during the 4.5 years of transit through the inner and outer earth trapped radiation belts. The majority of these SEE have been due to trapped protons determined by the orbit timing and the dose rate response of the engineering radiation monitor. Fault tolerant systems engineering and spacecraft operation have enabled a successful mission to date without a safe mode or spacecraft emergency.
Year of Publication
2017
Journal
IEEE Transactions on Nuclear Science
Volume
64
Number of Pages
2782-2793
Date Published
09/2017
ISSN Number
0018-9499
URL
http://ieeexplore.ieee.org/document/8047305/http://xplorestaging.ieee.org/ielx7/23/8106918/08047305.pdf?arnumber=8047305
DOI
10.1109/TNS.2017.2754878