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Radiation-Induced Single-Event Effects on the Van Allen Probes Spacecraft


AuthorMaurer, Richard; Fretz, Kristin; Angert, Matthew; Bort, David; Goldsten, John; Ottman, Geffrey; Dolan, Jeff; Needell, Gerald; Bodet, David;
KeywordsSpace vehicles; Probes; Belts; Orbits; Monitoring; protons; Observatories; Van Allen Probes
AbstractElectronic devices on the Van Allen Probes mission have experienced more than a thousand single-event effects (SEE) during the 4.5 years of transit through the inner and outer earth trapped radiation belts. The majority of these SEE have been due to trapped protons determined by the orbit timing and the dose rate response of the engineering radiation monitor. Fault tolerant systems engineering and spacecraft operation have enabled a successful mission to date without a safe mode or spacecraft emergency.
Year of Publication2017
JournalIEEE Transactions on Nuclear Science
Volume64
Number of Pages2782-2793
Section
Date Published09/2017
ISBN
URLhttp://ieeexplore.ieee.org/document/8047305/
DOI10.1109/TNS.2017.2754878