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Resonant scattering of energetic electrons by unusual low-frequency hiss

AuthorNi, Binbin; Li, Wen; Thorne, Richard; Bortnik, Jacob; Ma, Qianli; Chen, Lunjin; Kletzing, Craig; Kurth, William; Hospodarsky, George; Reeves, Geoffrey; Spence, Harlan; Blake, Bernard; Fennell, Joseph; Claudepierre, Seth;
KeywordsVan Allen Probes
AbstractWe quantify the resonant scattering effects of the unusual low-frequency dawnside plasmaspheric hiss observed on 30 September 2012 by the Van Allen Probes. In contrast to normal (~100\textendash2000 Hz) hiss emissions, this unusual hiss event contained most of its wave power at ~20\textendash200 Hz. Compared to the scattering by normal hiss, the unusual hiss scattering speeds up the loss of ~50\textendash200 keV electrons and produces more pronounced pancake distributions of ~50\textendash100 keV electrons. It is demonstrated that such unusual low-frequency hiss, even with a duration of a couple of hours, plays a particularly important role in the decay and loss process of energetic electrons, resulting in shorter electron lifetimes for ~50\textendash400 keV electrons than normal hiss, and should be carefully incorporated into global modeling of radiation belt electron dynamics during periods of intense injections.
Year of Publication2014
JournalGeophysical Research Letters
Number of Pages1854-1861
Date Published03/2014